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Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques.
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Previews available in: English
Subjects
Semiconductors, Testing, Engineering, Nonfiction, Technology, ElectronicsShowing 8 featured editions. View all 8 editions?
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1
Semiconductor Material and Device Characterization
2008, Wiley & Sons, Incorporated, John
in English
0470362502 9780470362501
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2
Semiconductor Material and Device Characterization
2006, John Wiley & Sons, Ltd.
Electronic resource
in English
0471749087 9780471749080
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3
Semiconductor Material and Device Characterization
2006, Wiley & Sons, Incorporated, John
in English
0471749095 9780471749097
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zzzz
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WorldCat
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4
Semiconductor material and device characterization
2006, IEEE Press, Wiley, Wiley-Interscience, Wiley-IEEE Press
in English
- 3rd ed.
0471739065 9780471739067
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5
Semiconductor Material and Device Characterization
2006, Wiley & Sons Canada, Limited, John
in English
1280654708 9781280654701
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zzzz
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6
Semiconductor material and device characterization
2005, John Wiley
in English
0471739065 9780471739067
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zzzz
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WorldCat
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7
Semiconductor material and device characterization
1998, Wiley
in English
- 2nd ed.
0471241393 9780471241393
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8 |
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Book Details
Edition Notes
Includes bibliographical references and index.
"A Wiley-Interscience publication."
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Work Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
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Feedback?December 19, 2023 | Edited by ImportBot | import existing book |
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