| Record ID | marc_loc_2016/BooksAll.2016.part26.utf8:77714782:1043 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part26.utf8:77714782:1043?format=raw |
LEADER: 01043cam a2200277 a 4500
001 97052094
003 DLC
005 20040706103228.0
008 971216s1998 nyua b 001 0 eng
010 $a 97052094
020 $a0471241393 (cloth : alk. paper)
040 $aDLC$cDLC$dDLC
050 00 $aQC611$b.S335 1998
082 00 $a621.3815/2$221
100 1 $aSchroder, Dieter K.
245 00 $aSemiconductor material and device characterization /$cDieter K. Schroder.
250 $a2nd ed.
260 $aNew York :$bWiley,$cc1998.
300 $axxiv, 760 p. :$bill. ;$c25 cm.
500 $a"A Wiley-Interscience publication."
504 $aIncludes bibliographical references and index.
650 0 $aSemiconductors.
650 0 $aSemiconductors$xTesting.
856 42 $3Contributor biographical information$uhttp://www.loc.gov/catdir/bios/wiley047/97052094.html
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/description/wiley032/97052094.html
856 4 $3Table of Contents$uhttp://www.loc.gov/catdir/toc/onix02/97052094.html