Optical characterization techniques for semiconductor technology

April 1-2, 1981, San Jose, California

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Last edited by ImportBot
July 28, 2023 | History

Optical characterization techniques for semiconductor technology

April 1-2, 1981, San Jose, California

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Publish Date
Language
English
Pages
262

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Previews available in: English

Book Details


Edition Notes

Includes bibliographical references and indexes.

Published in
Bellingham, Wash
Series
Proceedings of the Society of Photo-optical Instrumentation Engineers ;, v. 276

Classifications

Dewey Decimal Class
621.3815/2/0287
Library of Congress
TK7871.85 .O6

The Physical Object

Pagination
x, 262 p. :
Number of pages
262

Edition Identifiers

Open Library
OL3787004M
Internet Archive
isbn_0892523093_276
ISBN 10
0892523093
LCCN
81051404
OCLC/WorldCat
7472758

Work Identifiers

Work ID
OL19155786W

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July 28, 2023 Edited by ImportBot import existing book
December 9, 2022 Edited by MARC Bot import existing book
October 21, 2020 Edited by MARC Bot import existing book
March 10, 2019 Edited by MARC Bot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record