An edition of Spectroscopic charcterization techniques for semiconductor technology
(1983)
Spectroscopic characterization techniques for semiconductor technology
9-10 November 1983, Cambridge, Massachusetts
by Robert S. Bauer and Fred H. Pollak
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Previews available in: English
| Edition | Availability |
|---|---|
1
Spectroscopic characterization techniques for semiconductor technology: 9-10 November 1983, Cambridge, Massachusetts
1984, SPIE--the International Society for Optical Engineering
in English
0892524871 9780892524877
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2
Spectroscopic Characterization Techniques for Semiconductor Technology (Proceedings of Spie-The International Society for Optical Engineering Vol 452)
February 1984, SPIE--the International Society for Optical Engineering
Paperback
0892524871 9780892524877
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3
Spectroscopic charcterization techniques for semiconductor technology: November 9-10, 1983 Cambridge, Massachusetts
1983, SPIE--The International Society for Optical Engineering
in English
0892524871 9780892524877
|
zzzz
|
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Includes bibliographies and index.
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- Created September 18, 2008
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| March 7, 2023 | Edited by ImportBot | import existing book |
| January 14, 2023 | Edited by ImportBot | import existing book |
| April 9, 2019 | Edited by MARC Bot | import existing book |
| February 18, 2019 | Edited by MARC Bot | import existing book |
| September 18, 2008 | Created by ImportBot | Imported from Western Washington University MARC record |