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Last edited anonymously
April 30, 2008 | History
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Robert S. Bauer

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  • Cover of: Spectroscopic characterization techniques for semiconductor technology: 9-10 November 1983, Cambridge, Massachusetts

    First published in 1983 3 editions in 1 language — 1 previewable
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  • Cover of: Modern Cantonese phonology

    First published in 1997 3 editions in 1 language
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  • Cover of: Surface and interface effects in VLSI

    First published in 1985 2 editions in 1 language — 1 previewable
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  • Cover of: Proceedings of the 11th Annual Conference on the Physics and Chemistry of Semiconductor Interfaces, 31 January - 2 February 1984, Pinehurst, North Carolina

    First published in 1984 1 edition
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  • Cover of: Proceedings of the 12th Annual Conference on the Physics and Chemistry of Semiconductor Interfaces, 29-31 January 1985, Tempe, Arizona

    First published in 1985 1 edition
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  • Cover of: Proceedings of the 13th Annual Conference on the Physics and Chemistry of Semiconductor Interfaces, 28-30 January 1986, Pasadena, California

    First published in 1986 1 edition
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  • Cover of: Proceedings of the 14th Annual Conference on the Physics and Chemistry of Semiconductor Interfaces, 27-29 January 1987, Salt Lake City, Utah

    First published in 1987 1 edition
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  • Cover of: Proceedings of the Tenth Annual Conference on the Physics and Chemistry of Semiconductor Interfaces, 25-27 January 1983, Santa Fe, New Mexico

    First published in 1983 1 edition
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  • Cover of: ABC Cantonese-English Comprehensive Dictionary

    First published in 2020 1 edition in 1 language
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Subjects
Semiconductors, Congresses, Cantonese dialects, Chinese language, Chinese language, dialects, Chinese language, phonetics, Dictionaries, English, Instruments, Integrated circuits, Language and languages, Optical properties, Phonology, Spectrum analysis, Surfaces, Testing, Very large scale integration

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ID Numbers

  • OLID: OL3593144A

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History

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April 30, 2008 Created by an anonymous user initial import