On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond

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Last edited by MARC Bot
December 9, 2022 | History

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond

  • 0 Ratings
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Publish Date
Publisher
River Publishers
Language
English

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Book Details


Classifications

Library of Congress
TK7871.85, TK7871.85 .R86 2019

The Physical Object

Pagination
250
Weight
0.523

ID Numbers

Open Library
OL34657806M
ISBN 13
9788770221122
OCLC/WorldCat
1109817429

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History

Download catalog record: RDF / JSON
December 9, 2022 Edited by MARC Bot import existing book
October 6, 2021 Created by ImportBot import new book