On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond

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Last edited by MARC Bot
December 9, 2022 | History

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond

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Publish Date
Publisher
River Publishers
Language
English

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Book Details


Classifications

Library of Congress
TK7871.85, TK7871.85 .R86 2019

The Physical Object

Pagination
250
Weight
0.523

Edition Identifiers

Open Library
OL34657806M
ISBN 13
9788770221122
OCLC/WorldCat
1109817429

Work Identifiers

Work ID
OL25753008W

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
December 9, 2022 Edited by MARC Bot import existing book
December 9, 2021 Edited by PartnerCoverBot Added new cover
October 6, 2021 Created by ImportBot Imported from Better World Books record