Modern optical characterization techniques for semiconductors and semiconductor devices

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Last edited by MARC Bot
July 20, 2024 | History

Modern optical characterization techniques for semiconductors and semiconductor devices

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Publish Date
Language
English
Pages
282

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Edition Availability
Cover of: Modern optical characterization techniques for semiconductors and semiconductor devices
Modern optical characterization techniques for semiconductors and semiconductor devices
1987, SPIE--the International Society for Optical Engineering
in English

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Book Details


Edition Notes

Includes bibliographies and index.
"26-27 March 1987, Bay Point, Florida."

Published in
Bellingham, Wash., USA
Series
Proceedings of SPIE--the International Society for Optical Engineering ;, v. 794

Classifications

Dewey Decimal Class
621.381/7
Library of Congress
TK7872.T55 M63 1987

The Physical Object

Pagination
vi, 282 p. :
Number of pages
282

ID Numbers

Open Library
OL2411003M
ISBN 10
089252829X
LCCN
87061007
OCLC/WorldCat
506124326
Goodreads
2867491

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History

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July 20, 2024 Edited by MARC Bot import existing book
April 9, 2019 Created by MARC Bot import existing book