Modern optical characterization techniques for semiconductors and semiconductor devices

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Last edited by MARC Bot
July 20, 2024 | History

Modern optical characterization techniques for semiconductors and semiconductor devices

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Publish Date
Language
English
Pages
282

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Edition Availability
Cover of: Modern optical characterization techniques for semiconductors and semiconductor devices
Modern optical characterization techniques for semiconductors and semiconductor devices
1987, SPIE--the International Society for Optical Engineering
in English

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Book Details


Edition Notes

Includes bibliographies and index.
"26-27 March 1987, Bay Point, Florida."

Published in
Bellingham, Wash., USA
Series
Proceedings of SPIE--the International Society for Optical Engineering ;, v. 794

Classifications

Dewey Decimal Class
621.381/7
Library of Congress
TK7872.T55 M63 1987

The Physical Object

Pagination
vi, 282 p. :
Number of pages
282

ID Numbers

Open Library
OL2411003M
ISBN 10
089252829X
LCCN
87061007
OCLC/WorldCat
506124326
Goodreads
2867491

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 20, 2024 Edited by MARC Bot import existing book
January 14, 2023 Edited by ImportBot import existing book
November 6, 2020 Edited by MARC Bot import existing book
April 9, 2019 Edited by MARC Bot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record