An edition of Scanning electron microscopy (1985)

Scanning electron microscopy

physics of image formation and microanalysis

2nd completely rev. and updated ed.

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Cover of: Scanning electron microscopy by Ludwig Reimer
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Last edited by MARC Bot
July 15, 2024 | History
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An edition of Scanning electron microscopy (1985)

Scanning electron microscopy

physics of image formation and microanalysis

2nd completely rev. and updated ed.

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Springer
Language
English
Pages
527

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Previews available in: English

Subjects
Scanning electron microscopy, Microscopy, Electron, Scanning, Rasterelektronenmikroskopie, Microscopie électronique à balayage, Microanalyse par émission X., Scanning Electron microscope, Scanning electron microscopes

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Edition Availability
Cover of: Scanning electron microscopy
Scanning electron microscopy: physics of image formation and microanalysis
1998, Springer
in English - 2nd completely rev. and updated ed.
Libraries near you: WorldCat
Cover of: Scanning Electron Microscopy
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
January 1986, Springer
in English
Libraries near you: WorldCat
Cover of: Scanning electron microscopy
Scanning electron microscopy: physics of image formation and microanalysis
1985, Springer-Verlag
in English
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Berlin, New York
Series
Springer series in optical sciences ;, v. 45

Classifications

Dewey Decimal Class
502/.8/25
Library of Congress
QH212.S3 R452 1998, QD95-96

The Physical Object

Pagination
xiv, 527 p. :
Number of pages
527

ID Numbers

Open Library
OL365830M
Internet Archive
scanningelectron0000reim
ISBN 10
3540639764
LCCN
98026178
OCLC/WorldCat
39281893
Library Thing
6275679
Goodreads
2605545

Source records

Scriblio MARC record
Library of Congress MARC record
amazon.com record
Internet Archive item record
Library of Congress MARC record
Better World Books record
marc_columbia MARC record

First Sentence

"Unlike transmission electron microscopy (TEM) described in the counterpart to this book [1.1], scanning electron microscopy (SEM) can image and analyse bulk specimens [1.2-28]."

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History

Download catalog record: RDF / JSON
July 15, 2024 Edited by MARC Bot import existing book
February 26, 2022 Edited by ImportBot import existing book
July 26, 2021 Edited by ImportBot import existing book
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 9, 2009 Created by WorkBot add works page