An edition of Scanning electron microscopy
(1985)
Scanning electron microscopy
physics of image formation and microanalysis
2nd completely rev. and updated ed.
by Ludwig Reimer
Share
×Close
This edition doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
Previews available in: English
| Edition | Availability |
|---|---|
1
Scanning electron microscopy: physics of image formation and microanalysis
1998, Springer
in English
- 2nd completely rev. and updated ed.
3540639764 9783540639763
|
aaaa
|
2
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
January 1986, Springer
in English
0387135308 9780387135304
|
zzzz
|
3
Scanning electron microscopy: physics of image formation and microanalysis
1985, Springer-Verlag
in English
0387135308 9780387135304
|
cccc
|
Book Details
Edition Notes
Includes bibliographical references and index.
Classifications
The Physical Object
Edition Identifiers
Work Identifiers
Source records
Scriblio MARC recordLibrary of Congress MARC record
amazon.com record
Internet Archive item record
Library of Congress MARC record
Better World Books record
marc_columbia MARC record
First Sentence
"Unlike transmission electron microscopy (TEM) described in the counterpart to this book [1.1], scanning electron microscopy (SEM) can image and analyse bulk specimens [1.2-28]."
Community Reviews (0)
Lists
See All
History
- Created April 1, 2008
- 11 revisions
Wikipedia citation
×CloseCopy and paste this code into your Wikipedia page. Need help?
| July 15, 2024 | Edited by MARC Bot | import existing book |
| February 26, 2022 | Edited by ImportBot | import existing book |
| November 28, 2020 | Edited by MARC Bot | import existing book |
| April 30, 2020 | Edited by ImportBot | import existing book |
| April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |