An edition of Scanning electron microscopy
(1985)
Scanning Electron Microscopy
Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
by Ludwig Reimer
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Previews available in: English
| Edition | Availability |
|---|---|
1
Scanning electron microscopy: physics of image formation and microanalysis
1998, Springer
in English
- 2nd completely rev. and updated ed.
3540639764 9783540639763
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2
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
January 1986, Springer
in English
0387135308 9780387135304
|
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|
3
Scanning electron microscopy: physics of image formation and microanalysis
1985, Springer-Verlag
in English
0387135308 9780387135304
|
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|
Book Details
First Sentence
"Unlike transmission electron microscopy (TEM) described in the counterpart to this book [1.1], scanning electron microscopy (SEM) can image and analyse bulk specimens [1.2-28]."
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First Sentence
"Unlike transmission electron microscopy (TEM) described in the counterpart to this book [1.1], scanning electron microscopy (SEM) can image and analyse bulk specimens [1.2-28]."
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- Created April 29, 2008
- 6 revisions
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| December 29, 2011 | Edited by LC Bot | import new book |
| December 29, 2011 | Edited by LC Bot | import new book |
| August 5, 2010 | Edited by IdentifierBot | added LibraryThing ID |
| April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
| April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |