An edition of Scanning electron microscopy
(1985)
Scanning electron microscopy
physics of image formation and microanalysis
by Ludwig Reimer
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Scanning electron microscopyShowing 3 featured editions. View all 3 editions?
| Edition | Availability |
|---|---|
1
Scanning electron microscopy: physics of image formation and microanalysis
1998, Springer
in English
- 2nd completely rev. and updated ed.
3540639764 9783540639763
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WorldCat
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2
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
January 1986, Springer
in English
0387135308 9780387135304
|
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Libraries near you:
WorldCat
|
3
Scanning electron microscopy: physics of image formation and microanalysis
1985, Springer-Verlag
in English
0387135308 9780387135304
|
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Libraries near you:
WorldCat
|
Book Details
Published in
Berlin, New York
Edition Notes
Bibliography: p. [405]-446.
Includes index.
Classifications
The Physical Object
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First Sentence
"Unlike transmission electron microscopy (TEM) described in the counterpart to this book [1.1], scanning electron microscopy (SEM) can image and analyse bulk specimens [1.2-28]."
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| February 26, 2022 | Edited by ImportBot | import existing book |
| July 26, 2021 | Edited by ImportBot | import existing book |
| April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
| February 1, 2010 | Edited by WorkBot | add more information to works |
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