An edition of Spectroscopic charcterization techniques for semiconductor technology
(1983)
Spectroscopic Characterization Techniques for Semiconductor Technology (Proceedings of Spie-The International Society for Optical Engineering Vol 452)
by Robert S. Bauer and Fred H. Pollak
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Publish Date
February 1984
Pages
203
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Previews available in: English
Showing 3 featured editions. View all 3 editions?
| Edition | Availability |
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1
Spectroscopic characterization techniques for semiconductor technology: 9-10 November 1983, Cambridge, Massachusetts
1984, SPIE--the International Society for Optical Engineering
in English
0892524871 9780892524877
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2
Spectroscopic Characterization Techniques for Semiconductor Technology (Proceedings of Spie-The International Society for Optical Engineering Vol 452)
February 1984, SPIE--the International Society for Optical Engineering
Paperback
0892524871 9780892524877
|
aaaa
Libraries near you:
WorldCat
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3
Spectroscopic charcterization techniques for semiconductor technology: November 9-10, 1983 Cambridge, Massachusetts
1983, SPIE--The International Society for Optical Engineering
in English
0892524871 9780892524877
|
zzzz
Libraries near you:
WorldCat
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- Created April 30, 2008
- 4 revisions
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| July 30, 2019 | Edited by MARC Bot | associate edition with work OL18950634W |
| April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
| April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
| April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |