An edition of Reliability Of High Mobility Sige Channel Mosfets For Future Cmos Applications (2013)

Reliability of High Mobility Sige Channel MOSFETs for Future CMOS Applications

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Reliability of High Mobility Sige Channel MOS ...
Jacopo Franco, Ben Kaczer, Gui ...
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February 26, 2022 | History
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An edition of Reliability Of High Mobility Sige Channel Mosfets For Future Cmos Applications (2013)

Reliability of High Mobility Sige Channel MOSFETs for Future CMOS Applications

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Publish Date
Publisher
Springer London, Limited
Language
English

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Subjects
Metal oxide semiconductors, complementary, Semiconductors

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Edition Availability
Cover of: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Aug 23, 2016, Guido Groeseneken Jacopo Franco Ben Kaczer, Springer
paperback
Libraries near you: WorldCat
Cover of: Reliability Of High Mobility Sige Channel Mosfets For Future Cmos Applications
Reliability Of High Mobility Sige Channel Mosfets For Future Cmos Applications
2013, Springer
Libraries near you: WorldCat
Cover of: Reliability of High Mobility Sige Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility Sige Channel MOSFETs for Future CMOS Applications
2013, Springer London, Limited
in English
  • Not in Library
Libraries near you: WorldCat
Cover of: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Nov 27, 2013, Springer
paperback
Libraries near you: WorldCat

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Book Details

Classifications

Library of Congress
QC610.9-611.8

The Physical Object

Pagination
xix, 187

ID Numbers

Open Library
OL37179895M
ISBN 13
9789400776630

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Better World Books record

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February 26, 2022 Created by ImportBot Imported from Better World Books record