An edition of Reliability Of High Mobility Sige Channel Mosfets For Future Cmos Applications (2013)

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read
Cover of: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications by Jacopo Franco, Ben Kaczer, Guido Groeseneken
Not in Library

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today
Notes
  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read
Notes

Check nearby libraries

Buy this book

Last edited by ImportBot
September 27, 2020 | History
Edit
An edition of Reliability Of High Mobility Sige Channel Mosfets For Future Cmos Applications (2013)

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Springer
Pages
208

Check nearby libraries

Buy this book

Subjects
Metal oxide semiconductors, complementary, Semiconductors

Showing 4 featured editions. View all 4 editions?

Edition Availability
Cover of: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Aug 23, 2016, Guido Groeseneken Jacopo Franco Ben Kaczer, Springer
paperback
Libraries near you: WorldCat
Cover of: Reliability of High Mobility Sige Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility Sige Channel MOSFETs for Future CMOS Applications
2013, Springer London, Limited
in English
Libraries near you: WorldCat
Cover of: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Nov 27, 2013, Springer
paperback
  • Not in Library
Libraries near you: WorldCat
Cover of: Reliability Of High Mobility Sige Channel Mosfets For Future Cmos Applications
Reliability Of High Mobility Sige Channel Mosfets For Future Cmos Applications
2013, Springer
Libraries near you: WorldCat

Add another edition?

Book Details

The Physical Object

Format
paperback
Number of pages
208

ID Numbers

Open Library
OL30522844M
ISBN 10
9400776640
ISBN 13
9789400776647

Source records

amazon.com record

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
September 27, 2020 Created by ImportBot Imported from amazon.com record