Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

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Last edited by ImportBot
October 5, 2021 | History

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

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Publish Date
Pages
208

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Edition Availability
Cover of: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Aug 23, 2016, Guido Groeseneken Jacopo Franco Ben Kaczer, Springer
paperback
Cover of: Reliability Of High Mobility Sige Channel Mosfets For Future Cmos Applications
Cover of: Reliability of High Mobility Sige Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility Sige Channel MOSFETs for Future CMOS Applications
2013, Springer London, Limited
in English
Cover of: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Nov 27, 2013, Springer
paperback

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Book Details


Edition Notes

Source title: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics)

Classifications

Library of Congress
QC1-75

The Physical Object

Format
paperback
Number of pages
208

ID Numbers

Open Library
OL28047524M
ISBN 10
9402402055
ISBN 13
9789402402056

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
October 5, 2021 Edited by ImportBot import existing book
May 14, 2020 Created by ImportBot Imported from amazon.com record