An edition of IWSM
(1998)
Statistical Metrology, 1998 3rd Workshop
by International Workshop on Statistical Me..., IEEE Electron Devices Society, and Institute of Electrical and Electronics ...
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Last edited by Charles Horn
August 26, 2021 | History
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Subjects
Semiconductors, Congresses, Statistical methods, Characterization, Measurement, Engineering measurement & calibration, Mathematics for scientists & engineers, Technology & Industrial Arts, Engineering Statistics, Very-Large-Scale Integration (Vlsi), Technology, Science/Mathematics, Electronics - Semiconductors, Mensuration, Reference| Edition | Availability |
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1
Statistical Metrology, 1998 3rd Workshop
July 1998, Institute of Electrical & Electronics Enginee
Paperback
in English
0780343387 9780780343382
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2
IWSM: 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
1998, IEEE, Widerkehr and Associates
in English
0780343387 9780780343382
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3
IWSM: 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
1998, Widerkehr and Associates
Unknown Binding
in English
0780343395 9780780343399
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- Created April 29, 2008
- 6 revisions
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| August 26, 2021 | Edited by Charles Horn | merge authors |
| July 31, 2019 | Edited by MARC Bot | associate edition with work OL2776376W |
| April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
| April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
| April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |