An edition of Microelectronics failure analysis (2004)

Microelectronics failure analysis

desk reference

5th ed.

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Last edited by ImportBot
July 19, 2023 | History
An edition of Microelectronics failure analysis (2004)

Microelectronics failure analysis

desk reference

5th ed.

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
ASM International
Language
English
Pages
800

Buy this book

Previews available in: English

Edition Availability
Cover of: Microelectronics failure analysis
Microelectronics failure analysis: desk reference
2004, ASM International
in English - 5th ed.

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Book Details


Table of Contents

Introduction
Failure analysis process flow
Failure verification
Failure mode: failure classifications
Special devices
Non-destructive analysis techniques
Depackaging
Photon emission (electroluminescence) localization techniques
Microthermography
Laser and particle beam-based localization techniques
Deprocessing
General imaging techniques
Local deprocessing and imaging
Materials analysis techniques
Important topics for semiconductor devices
FA techniques/tools roadmaps
FA operation and management
Appendix.

Edition Notes

System requirements for accompanying CD-ROM: Windows 95/98/NT/ME/2000/XP ; Macintosh 8/9/Classic.
Includes bibliographical references and index.

Published in
Materials Park, Ohio
Genre
Handbooks, manuals, etc.

Classifications

Library of Congress
TK7871 .M52 2004, TK7874.58 .M53 2004x

The Physical Object

Pagination
xiv, 800 p. :
Number of pages
800

ID Numbers

Open Library
OL3437382M
Internet Archive
isbn_0871708043_5
ISBN 10
0871708043
LCCN
2005295019
OCLC/WorldCat
57017140

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 19, 2023 Edited by ImportBot import existing book
March 7, 2023 Edited by MARC Bot import existing book
December 30, 2022 Edited by MARC Bot import existing book
December 11, 2020 Edited by MARC Bot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record