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Microelectronics failure analysis: desk reference
2004, ASM International
in English
- 5th ed.
0871708043 9780871708045
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Book Details
Table of Contents
Introduction
Failure analysis process flow
Failure verification
Failure mode: failure classifications
Special devices
Non-destructive analysis techniques
Depackaging
Photon emission (electroluminescence) localization techniques
Microthermography
Laser and particle beam-based localization techniques
Deprocessing
General imaging techniques
Local deprocessing and imaging
Materials analysis techniques
Important topics for semiconductor devices
FA techniques/tools roadmaps
FA operation and management
Appendix.
Edition Notes
System requirements for accompanying CD-ROM: Windows 95/98/NT/ME/2000/XP ; Macintosh 8/9/Classic.
Includes bibliographical references and index.
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- Created April 1, 2008
- 7 revisions
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July 19, 2023 | Edited by ImportBot | import existing book |
March 7, 2023 | Edited by MARC Bot | import existing book |
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April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |