An edition of MOS Interface Physics Process and Characterization
(2021)
MOS Interface Physics, Process and Characterization
by Shengkai Wang and Xiaolei Wang
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Subjects
Engineering, Metal oxide semiconductors, Design and construction, Mathematics, Semiconductors, Junctions, Integrated circuits, Research, Solid state physics, Experiments, Semi-conducteurs, Jonctions, Circuits intégrés, Recherche, Physique de l'état solide, Expériences, TECHNOLOGY / General, TECHNOLOGY / Electronics / General, TECHNOLOGY / Electronics / Microelectronics| Edition | Availability |
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1
MOS Interface Physics, Process and Characterization
2021, Taylor & Francis Group
in English
1000455742 9781000455748
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2
MOS Interface Physics, Process and Characterization
2021, Taylor & Francis Group
in English
1000455769 9781000455762
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3
MOS Interface Physics, Process and Characterization
2021, Taylor & Francis Group
in English
1003216285 9781003216285
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4
MOS Interface Physics Process and Characterization
2021, Taylor & Francis Group, CRC Press
in English
1032106271 9781032106274
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5
MOS Interface Physics, Process and Characterization
2021, CRC Press LLC
in English
103210628X 9781032106281
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- Created September 28, 2021
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| September 28, 2021 | Created by ImportBot | Imported from Better World Books record |