An edition of Advanced VLSI Design and Testability Issues (2020)

Advanced VLSI Design and Testability Issues

by , , and

Advanced VLSI Design and Testability Issues
Suman Lata Tripathi, Sobhit Sa ...
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Last edited by ImportBot
August 26, 2020 | History
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An edition of Advanced VLSI Design and Testability Issues (2020)

Advanced VLSI Design and Testability Issues

by , , and

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Publish Date
Publisher
Taylor & Francis Group
Language
English
Pages
362

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Subjects

Integrated circuits, Very large scale integration, Design and construction, TECHNOLOGY, Electricity, Electronics, Circuits, General
Edition Availability
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2022, Taylor & Francis Group
in English
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
Cover of: Advanced Vlsi Design and Testability Issues
Advanced Vlsi Design and Testability Issues
2020, Taylor & Francis Group, CRC Press
in English
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English

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Book Details

Classifications

Library of Congress

Edition Identifiers

Open Library
OL29508307M
ISBN 13
9781000168167

Work Identifiers

Work ID
OL21690268W

Source records

Better World Books record

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
August 26, 2020 Created by ImportBot Imported from Better World Books record