An edition of Advanced VLSI Design and Testability Issues
(2020)
Advanced VLSI Design and Testability Issues
by Suman Lata Tripathi, Sobhit Saxena, and Sushanta Kumar Mohapatra
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| Edition | Availability |
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1
Advanced VLSI Design and Testability Issues
2022, Taylor & Francis Group
in English
0367538369 9780367538361
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2
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
1000168158 9781000168150
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3
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
1000168174 9781000168174
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4
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
1000168166 9781000168167
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5
Advanced Vlsi Design and Testability Issues
2020, Taylor & Francis Group, CRC Press
in English
0367492822 9780367492823
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6
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
1003083439 9781003083436
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- Created August 26, 2020
- 2 revisions
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| December 16, 2022 | Edited by MARC Bot | import existing book |
| August 26, 2020 | Created by ImportBot | Imported from Better World Books record |