An edition of Proceedings (1999)

Proceedings

1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : November 1-3, 1999, Albuquerque, New Mexico

by , , and

Cover of: Proceedings by IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1999 Albuquerque, N.M.), IEEE Computer Society, Institute of Electrical and Electronics Engineers, IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1999 Albuquerque, N.M.)
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Last edited by bgimpertBot
April 16, 2010 | History
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An edition of Proceedings (1999)

Proceedings

1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : November 1-3, 1999, Albuquerque, New Mexico

by , , and

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Publish Date
Publisher
IEEE Computer Society Press
Language
English
Pages
405

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Subjects

Congresses, Very large scale integration, Design and construction, Integrated circuits, Fault-tolerant computing, Systems management, Electronic Measurements, Very-Large-Scale Integration (Vlsi), Technology & Engineering, Computers - General Information, Science/Mathematics, General, Electronics - Circuits - VLSI, Engineering - Electrical & Electronic
Edition Availability
Cover of: 1999 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft '99): November 1-3, 1999 Albuquerque, New Mexico
1999 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft '99): November 1-3, 1999 Albuquerque, New Mexico: Proceedings
January 1999, Institute of Electrical & Electronics Enginee
Paperback in English
Cover of: Proceedings
Proceedings: 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : November 1-3, 1999, Albuquerque, New Mexico
1999, IEEE Computer Society Press
in English

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Book Details

Edition Notes

"IEEE Computer Society Press Order Number PR00325"-verso of T.p.

Includes bibliographical references and author index.

Published in
Los Alamitos, California
Genre
Congresses.
Other Titles
1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Defect and fault tolerance in VLSI systems, DFT'99

The Physical Object

Pagination
xiii, 405 p. :
Number of pages
405

Edition Identifiers

Open Library
OL19019640M
ISBN 10
076950325X, 0769503276
OCLC/WorldCat
42962923
Goodreads
3328288

Work Identifiers

Work ID
OL12608439W

Source records

Oregon Libraries MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
April 16, 2010 Edited by bgimpertBot Added goodreads ID.
April 13, 2010 Edited by Open Library Bot Linked existing covers to the edition.
December 15, 2009 Edited by WorkBot link works
April 21, 2009 Edited by ImportBot add OCLC number
October 20, 2008 Created by ImportBot Imported from Oregon Libraries MARC record