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Last edited anonymously
April 30, 2008 | History
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Wolfgang Osten

We need a photo of Wolfgang Osten

25 works Add another?

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  • Cover of: Optical inspection of microsystems

    First published in 2006 — 6 editions
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  • Cover of: Optical Inspection of Microsystems, Second Edition

    First published in 2019 — 5 editions
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  • Cover of: Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology

    First published in 2013 — 4 editions
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  • Cover of: Fringe 2009: 6th International Workshop on Advanced Optical Metrology

    First published in 2009 — 4 editions
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  • Cover of: Optical Imaging and Metrology: Advanced Technologies

    First published in 2012 — 4 editions
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  • Cover of: Interferometry XIV.: 13-14 August 2008, San Diego, California, USA

    First published in 2008 — 3 editions
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  • Cover of: Interferometry XIII.: 16-17 August, 2006, San Diego, California, USA

    First published in 2006 — 2 editions
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  • Cover of: Fringe 2005: The 5th International Workshop on Automatic Processing of Finge Patterns

    First published in 2005 — 2 editions
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  • Cover of: Interferometry XI

    First published in 2002 — 2 editions
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  • Cover of: Simulation and Experiment in Laser Metrology: Proceedings of the International Symposium on Laser Applications in Precision Measurements held in Balatonfüred/Hungary, ... 3-6, 1996 (AKV Series in Optical Metrology)

    First published in 1996 — 1 edition
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  • Cover of: Optical Inspection of Microsystems. Optical Science and Engineering

    First published in 2010 — 1 edition
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  • Cover of: Fringe 2005: The 5th International Workshop on Automatic Processing of Finge Patterns

    First published in 2006 — 1 edition
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  • Cover of: Holography and Speckle: A Review of 60 Successful Years

    First published in 2023 — 1 edition
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  • Cover of: Optical measurement systems for industrial inspection VII: 23-26 May 2011, Munich, Germany

    First published in 2011 — 1 edition
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  • Cover of: Optical measurement systems for industrial inspection II: application in industrial design : 18-19 June, 2001, Munich, Germany

    First published in 2001 — 1 edition
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  • Cover of: Advanced photonic sensors and applications II: 27-30 November, 2001, Singapore

    First published in 2001 — 1 edition
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  • Cover of: Optical measurement systems for industrial inspection III: 23-26 June 2003, Munich, Germany

    First published in 2003 — 1 edition
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  • Cover of: Optical Micro- And Nanometrology IV

    First published in 2012 — 1 edition
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  • Cover of: Optical Micro- and Nanometrology V

    First published in 2014 — 1 edition
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  • Cover of: Optical measurement systems for industrial inspection V: 18-22 June 2007, Munich, Germany

    First published in 2007 — 1 edition
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We need a photo of Wolfgang Osten

Subjects

Congresses, Industrial applications, Optical detectors, Optical methods, Quality control, Optical instruments, Optical measurements, Interferometry, Measurement, Engineering, Image processing, Meteorology, Metrology, Microelectromechanical systems, Microscopy, Automatisation, Biosensors, Chemistry, Computer vision, Contrôle, Contrôle technique, Data processing, Design and construction, Diffraction, Diffraction patterns

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ID Numbers

  • OLID: OL3164889A

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History

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April 30, 2008 Created by an anonymous user initial import