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Last edited anonymously
April 30, 2008 | History
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Fred H. Pollak

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8 works Add another?

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  • Cover of: Spectroscopic characterization techniques for semiconductor technology: 9-10 November 1983, Cambridge, Massachusetts

    First published in 1983 — 3 editions
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  • Cover of: Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions: final report

    First published in 1990 — 2 editions
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  • Cover of: Spectroscopic characterization techniques for semiconductor technology III: 14-15 March 1988, Newport Beach, California

    First published in 1988 — 2 editions
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  • Cover of: Layered structures: heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.

    First published in 1990 — 2 editions
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  • Cover of: Spectroscopic characterization techniques for semiconductor technology II: January 21-22, 1985, Los Angeles, California

    First published in 1985 — 1 edition
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  • Cover of: Modern optical characterization techniques for semiconductors and semiconductor devices

    First published in 1987 — 1 edition
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  • Cover of: Surface and interface analysis of microelectronic materials processing and growth: 12-13 October 1989, Santa Clara, California

    First published in 1990 — 1 edition
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  • Cover of: Diagnostic Techniques for Semiconductor Materials Processing II: Symposium Held November 27-30, 1995, Boston, Massachusetts, U.S.A (Materials Research Society Symposium Proceedings)

    First published in 1996 — 1 edition
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We need a photo of Fred H. Pollak

Subjects

Congresses, Semiconductors, Testing, Spectrum analysis, Materials, Optical properties, Analysis, Crystallography, Effect of reduced gravity on, Epitaxy, Instruments, Layer structure (Solids), Materials, dynamic testing, Microelectronics, Optical methods, Science, Science/Mathematics, Solid State Physics, Strains and stresses, Structural dynamics, Superlattices as materials, Surfaces (Technology), Thin film devices, Thin films

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ID Numbers

  • OLID: OL3040272A

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History

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April 30, 2008 Created by an anonymous user initial import