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Analysis, Congresses, SemiconductorsShowing 1 featured edition. View all 1 editions?
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Analytical and diagnostic techniques for semiconductor materials, devices and processes: joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
1999, Electrochemical Society
in English
1566772397 9781566772396
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Edition Notes
Includes bibliographical references and indexes.
ALTECH 99 was held Sept. 16-17, 1999, jointly with ESSDERC 99, the 29th European Solid State Device Research Conference, and the ECS Symposium on Diagnostic Techniques for Semiconductor Materials and Devices was held as part of the 1999 Joint International Meeting, 196th Meeting of the Electrochemical Society and the 1999 Fall Meeting of the Electrochemical Society of Japan, Honolulu, Hawaii, Oct. 17-22.
"Published in cooperation with the International Society for Optical Engineering."
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Feedback?December 4, 2010 | Edited by Open Library Bot | Added subjects from MARC records. |
April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
December 8, 2009 | Created by ImportBot | add works page |