Analytical and diagnostic techniques for semiconductor materials, devices and processes
joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
by ALTECH 99 (1999 Leuven, Belgium)
- 0 Ratings
- 0 Want to read
- 0 Currently reading
- 0 Have read
This edition doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
Subjects
Analysis, Congresses, SemiconductorsShowing 1 featured edition. View all 1 editions?
| Edition | Availability |
|---|---|
1
Analytical and diagnostic techniques for semiconductor materials, devices and processes: joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
1999, Electrochemical Society
in English
1566772397 9781566772396
|
aaaa
Libraries near you:
WorldCat
|
Book Details
Published in
Pennington, N.J
Edition Notes
Includes bibliographical references and indexes.
ALTECH 99 was held Sept. 16-17, 1999, jointly with ESSDERC 99, the 29th European Solid State Device Research Conference, and the ECS Symposium on Diagnostic Techniques for Semiconductor Materials and Devices was held as part of the 1999 Joint International Meeting, 196th Meeting of the Electrochemical Society and the 1999 Fall Meeting of the Electrochemical Society of Japan, Honolulu, Hawaii, Oct. 17-22.
"Published in cooperation with the International Society for Optical Engineering."
Classifications
The Physical Object
ID Numbers
Community Reviews (0)
Feedback?
| December 4, 2010 | Edited by Open Library Bot | Added subjects from MARC records. |
| April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
| December 8, 2009 | Created by ImportBot | add works page |