Evaluation of advanced semiconductor materials by electron microscopy

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Last edited by Open Library Bot
December 4, 2010 | History

Evaluation of advanced semiconductor materials by electron microscopy

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Publish Date
Publisher
Plenum Press
Language
English
Pages
412

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Edition Availability
Cover of: Evaluation of advanced semiconductor materials by electron microscopy

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Book Details


Published in

New York

Edition Notes

Includes bibliographical references.
"Proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12-17, 1988, in Bristol, United Kingdom"--Verso t.p.
"Held within the program of activities of the NATO Special Program on Condensed Systems of Low Dimensionality, running from 1983 to 1988 as part of the activities of the NATO Science Committee"--P. [v].
"Published in cooperation with NATO Scientific Affairs Division."

Series
NATO ASI series. Series B, Physics ;, vol. 203, NATO ASI series., v. 203.

Classifications

Dewey Decimal Class
530.4/1
Library of Congress
QC611.6.S9 N36 1988

The Physical Object

Pagination
xi, 412 p. :
Number of pages
412

ID Numbers

Open Library
OL2196697M
ISBN 10
0306433621
LCCN
89016354
Goodreads
4835299

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History

Download catalog record: RDF / JSON
December 4, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page