Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

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Last edited by Open Library Bot
December 4, 2010 | History

Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

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Publish Date
Language
English
Pages
289

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Edition Availability
Cover of: Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

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Book Details


Edition Notes

Includes bibliographies and indexes.
Sponsored by the Electronics and Dielectrics and Insulation Divisions.

Published in
Pennington, NJ (10 S. Main St., Pennington 08534-2896)
Series
Proceedings ;, v. 88-20, Proceedings (Electrochemical Society) ;, v. 88-20.

Classifications

Dewey Decimal Class
621.381/52
Library of Congress
TK7871.85 .S954 1988

The Physical Object

Pagination
vi, 289 p. :
Number of pages
289

ID Numbers

Open Library
OL2069549M
LCCN
88082408
OCLC/WorldCat
19282155

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History

Download catalog record: RDF / JSON
December 4, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page