Electron and ion microscopy and microanalysis

principles and applications

2nd ed., rev. and expanded.

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Last edited by MARC Bot
July 18, 2024 | History

Electron and ion microscopy and microanalysis

principles and applications

2nd ed., rev. and expanded.

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Publish Date
Publisher
M. Dekker, CRC Press
Language
English
Pages
837

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Previews available in: English

Edition Availability
Cover of: Electron and Ion Microscopy and Microanalysis
Electron and Ion Microscopy and Microanalysis: Principles and Applications
2019, Taylor & Francis Group
in English
Cover of: Electron and ion microscopy and microanalysis
Electron and ion microscopy and microanalysis: principles and applications
1991, M. Dekker, CRC Press
in English - 2nd ed., rev. and expanded.
Cover of: Electron and ion microscopy and microanalysis
Electron and ion microscopy and microanalysis: principles and applications
1982, Marcel Dekker
in English

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Book Details


Edition Notes

Includes bibliographical references and indexes.

Published in
New York
Series
Optical engineering ;, 29, Optical engineering (Marcel Dekker, Inc.) ;, v. 29.

Classifications

Dewey Decimal Class
502/.8/25
Library of Congress
QH212.E4 M87 1991, QH212.E4M87 1991, QH212.E4 M87 1991eb

The Physical Object

Pagination
xiv, 837 p. :
Number of pages
837

Edition Identifiers

Open Library
OL1541448M
ISBN 10
0824785568
LCCN
91020173
OCLC/WorldCat
48139870, 23974033

Work Identifiers

Work ID
OL4094125W

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History

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July 18, 2024 Edited by MARC Bot import existing book
December 12, 2022 Edited by MARC Bot import existing book
August 14, 2020 Edited by ImportBot import existing book
December 4, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page