Electron and ion microscopy and microanalysis

principles and applications

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Last edited by MARC Bot
December 21, 2024 | History

Electron and ion microscopy and microanalysis

principles and applications

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Marcel Dekker
Language
English
Pages
793

Buy this book

Previews available in: English

Edition Availability
Cover of: Electron and Ion Microscopy and Microanalysis
Electron and Ion Microscopy and Microanalysis: Principles and Applications
2019, Taylor & Francis Group
in English
Cover of: Electron and ion microscopy and microanalysis
Electron and ion microscopy and microanalysis: principles and applications
1991, M. Dekker, CRC Press
in English - 2nd ed., rev. and expanded.
Cover of: Electron and ion microscopy and microanalysis
Electron and ion microscopy and microanalysis: principles and applications
1982, Marcel Dekker
in English

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Book Details


Edition Notes

Includes bibliographical references and indexes.

Published in
New York
Series
Optical engineering ;, v. 1, Optical engineering (Marcel Dekker, Inc.) ;, v. 1.

Classifications

Dewey Decimal Class
502/.8/25
Library of Congress
QH212.E4 M87 1982

The Physical Object

Pagination
xiv, 793 p. :
Number of pages
793

Edition Identifiers

Open Library
OL3494900M
ISBN 10
0824715535
LCCN
82014872
OCLC/WorldCat
8689690
Goodreads
3126465

Work Identifiers

Work ID
OL4094125W

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History

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December 21, 2024 Edited by MARC Bot import existing book
December 9, 2022 Edited by MARC Bot import existing book
October 21, 2020 Edited by MARC Bot import existing book
April 5, 2019 Edited by ImportBot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record