An edition of Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
(1995)
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
by W. Murray Bullis
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Publish Date
1995
Publisher
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Language
English
Pages
51
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United States| Edition | Availability |
|---|---|
1
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
1995, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
zzzz
|
|
2
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
1995, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
zzzz
|
|
3
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
1995, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
zzzz
|
|
4
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
1995, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
aaaa
|
Book Details
Edition Notes
Distributed to depository libraries in microfiche.
Shipping list no.: 97-0518-M.
Paper version no longer available for sale by the Supt. of Docs.
"December 1995."
Includes bibliographical references.
Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1997] 1 microfiche : negative.
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