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Last edited by RenameBot
August 28, 2008 | History
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W. Murray Bullis

We need a photo of W. Murray Bullis

Born 1930

7 works Add another?

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  • Cover of: Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

    First published in 1995 4 editions in 1 language
    Not in Library

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  • Cover of: Semiconductor measurement technology: evolution of silicon materials characterization : lessons learned for improved manufacturing

    First published in 1993 2 editions in 1 language
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  • Cover of: Evolution of silicon materials characterization: lessons learned for improved manufacturing

    First published in 1993 1 edition in 1 language
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  • Cover of: Measurement methods for the semiconductor device industry - a summary of NBS activity

    First published in 1969 1 edition in 1 language
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  • Cover of: Measurement of carrier lifetime in semiconductors: an annotated bibliography covering the period 1949-1967

    First published in 1968 1 edition in 1 language
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  • Cover of: Metrology for submicrometer devices and circuits

    First published in 1980 1 edition in 1 language
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  • Cover of: Semiconductor Characterization: Present Status and Future Needs

    First published in 1996 1 edition in 1 language
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We need a photo of W. Murray Bullis

Born 1930
Subjects
Semiconductors, Testing, Characterization, Integrated circuits, Semiconductor wafers, Bibliography, Congresses, Design and construction, Electronics, Materials, Measurement, Microelectronics, Optical methods, Semiconductor industry, Silicon, Standards, Wafer-scale integration
Places
United States

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ID Numbers

  • OLID: OL627288A

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History

Download catalog record: RDF / JSON
August 28, 2008 Edited by RenameBot fix author name
April 1, 2008 Created by an anonymous user initial import