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Reliability, yield, and stress burn-in: a unified approach for microelectronics systems manufacturing & software development
1998, Kluwer Academic Publishers
in English
0792381076 9780792381075
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Book Details
Published in
Boston, Mass
Edition Notes
Includes bibliographical references (p. [333]-361) and index.
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Feedback?February 26, 2022 | Edited by ImportBot | import existing book |
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