An edition of Scanning probe microscopy
(2006)
Scanning Probe Microscopy
Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
by Andrew J. Fisher, Werner A. Hofer, and Lev Kantorovich
- 0 Want to read
- 0 Currently reading
- 0 Have read
Share
×Close
This edition doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
Previews available in: English
Showing 2 featured editions. View all 2 editions?
| Edition | Availability |
|---|---|
1
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents
2010, Springer New York
in English
1441923063 9781441923066
|
zzzz
Libraries near you:
WorldCat
|
2
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
June 28, 2006, Springer
in English
0387400907 9780387400907
|
aaaa
Libraries near you:
WorldCat
|
Book Details
Classifications
ID Numbers
Community Reviews (0)
Feedback?
| August 9, 2024 | Edited by MARC Bot | import existing book |
| February 25, 2022 | Edited by ImportBot | import existing book |
| July 7, 2019 | Edited by MARC Bot | import existing book |
| July 28, 2014 | Created by ImportBot | import new book |