An edition of Scanning probe microscopy
(2006)
Scanning Probe Microscopy
Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
by Andrew J. Fisher, Werner A. Hofer, and Lev Kantorovich
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Previews available in: English
| Edition | Availability |
|---|---|
1
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents
2010, Springer New York
in English
1441923063 9781441923066
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2
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
June 28, 2006, Springer
in English
0387400907 9780387400907
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- Created April 29, 2008
- 14 revisions
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| 1 day ago | Edited by MARC Bot | import existing book |
| August 9, 2024 | Edited by MARC Bot | import existing book |
| December 30, 2022 | Edited by MARC Bot | import existing book |
| February 25, 2022 | Edited by ImportBot | import existing book |
| April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |