An edition of Scanning probe microscopy (2006)

Scanning Probe Microscopy

Atomic Scale Engineering by Forces and Currents

by , , and

Scanning Probe Microscopy
Andrew J. Fisher, Werner A. Ho ...
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Last edited by ImportBot
February 26, 2022 | History
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An edition of Scanning probe microscopy (2006)

Scanning Probe Microscopy

Atomic Scale Engineering by Forces and Currents

by , , and

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Publish Date
Publisher
Springer New York
Language
English

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Previews available in: English

Subjects

Scanning probe microscopy, Scanning electron microscopy
Edition Availability
Cover of: Scanning Probe Microscopy
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents
2010, Springer New York
in English
Cover of: Scanning Probe Microscopy
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
June 28, 2006, Springer
in English

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Book Details

Classifications

Library of Congress
TA418.5-.84

The Physical Object

Pagination
xiv, 282
Weight
0.456

Edition Identifiers

Open Library
OL37118705M
ISBN 13
9781441923066

Work Identifiers

Work ID
OL16925797W

Source records

Better World Books record

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February 26, 2022 Created by ImportBot Imported from Better World Books record