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Previews available in: English
Showing 3 featured editions. View all 3 editions?
Edition | Availability |
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1
Thin Film Analysis by X-Ray Scattering
2006, Wiley & Sons, Incorporated, John
in English
3527607048 9783527607044
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2
Thin Film Analysis by X-Ray Scattering
2006, Wiley-VCH Verlag GmbH
in English
3527607595 9783527607594
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3
Thin Film Analysis by X-Ray Scattering
February 6, 2006, Wiley-VCH
Hardcover
in English
3527310525 9783527310524
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Book Details
First Sentence
"Diffraction effects are observed when electromagnetic radiation impinges on periodic structures with geometrical variations on the length scale of the wavelength of the radiation."
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- Created April 30, 2008
- 19 revisions
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December 20, 2023 | Edited by ImportBot | import existing book |
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April 30, 2008 | Created by an anonymous user | Imported from amazon.com record. |