An edition of Thin Film Analysis by X-Ray Scattering (2006)

Thin Film Analysis by X-Ray Scattering

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Thin Film Analysis by X-Ray Scattering
Mario Birkholz
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Last edited by ImportBot
August 20, 2020 | History
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An edition of Thin Film Analysis by X-Ray Scattering (2006)

Thin Film Analysis by X-Ray Scattering

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Publish Date
Publisher
Wiley-VCH Verlag GmbH
Language
English
Pages
378

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Previews available in: English

Subjects
X-ray spectroscopy, Thin films, Structural analysis (engineering), X-rays, scattering, Qc176.83 .b57 2006, 530.4275

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Edition Availability
Cover of: Thin Film Analysis by X-Ray Scattering
Thin Film Analysis by X-Ray Scattering
February 6, 2006, Wiley-VCH
Hardcover in English
Libraries near you: WorldCat
Cover of: Thin Film Analysis by X-Ray Scattering
Thin Film Analysis by X-Ray Scattering
2006, Wiley & Sons, Incorporated, John
in English
Libraries near you: WorldCat
Cover of: Thin Film Analysis by X-Ray Scattering
Thin Film Analysis by X-Ray Scattering
2006, Wiley-VCH Verlag GmbH
in English
  • Not in Library
Libraries near you: WorldCat

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Book Details

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Library of Congress

ID Numbers

Open Library
OL28983719M
ISBN 13
9783527607594

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August 20, 2020 Created by ImportBot Imported from Better World Books record.