An edition of International Test Conference 1992
(1992)
IEEE International Test Conference
by International Test Conference (1992 Balt...
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Subjects
Congresses, Integrated circuits, Semiconductors, TestingShowing 4 featured editions. View all 4 editions?
| Edition | Availability |
|---|---|
1
IEEE International Test Conference
January 31, 1993, I.E.E.E.Press
Hardcover
in English
0780307607 9780780307605
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aaaa
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WorldCat
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2
Discover the new world of test and design: International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA
1992, Can be ordered from IEEE Service Center
Unknown Binding
in English
0818631678 9780818631672
|
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WorldCat
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3
International Test Conference 1992: proceedings.
1992, IEEE Service Center
in English
0818631678 9780818631672
|
zzzz
Libraries near you:
WorldCat
|
4
Proceedings: international test conference, 1992.
1992, The Conference
in English
0780307607 9780780307605
|
zzzz
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- Created April 29, 2008
- 3 revisions
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| July 31, 2019 | Edited by MARC Bot | associate edition with work OL4327192W |
| April 14, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
| April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |