In a conventional TEM, electrons are emitted from an electron gun and focused by the condenser lens as a beam, which illuminates the specimen.
An edition of Reflection Electron Microscopy and Spectroscopy for Surface Analysis
(1996)
Reflection electron microscopy and spectroscopy for surface analysis
by Zhong Lin Wang
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
2010, Cambridge University Press
in English
0511525257 9780511525254
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
August 22, 2005, Cambridge University Press
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0521017955 9780521017954
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Reflection electron microscopy and spectroscopy for surface analysis
1996, Cambridge University Press
in English
0521482666 9780521482660
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Includes bibliographical references (p. 419-430) and indexes.
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- Created April 1, 2008
- 8 revisions
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| August 2, 2024 | Edited by MARC Bot | import existing book |
| November 20, 2020 | Edited by MARC Bot | import existing book |
| August 23, 2020 | Edited by ImportBot | import existing book |
| April 14, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
| April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |