Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Reflection Electron Microscopy and Spectrosco ...
Zhong Lin Wang, Zhong Lin Wang
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October 4, 2021 | History

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

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Publish Date
Language
English

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Edition Availability
Cover of: Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
2010, Cambridge University Press
in English
Cover of: Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
August 22, 2005, Cambridge University Press
Paperback in English - New Ed edition
Cover of: Reflection electron microscopy and spectroscopy for surface analysis
Reflection electron microscopy and spectroscopy for surface analysis
1996, Cambridge University Press
in English

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Book Details


Edition Identifiers

Open Library
OL34442144M
ISBN 13
9780511525254

Work Identifiers

Work ID
OL2736745W

Source records

Better World Books record

Excerpts

In a conventional TEM, electrons are emitted from an electron gun and focused by the condenser lens as a beam, which illuminates the specimen.
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October 4, 2021 Created by ImportBot Imported from Better World Books record