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Edition | Availability |
---|---|
1
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Nov 10, 2010, Springer
paperback
1441942858 9781441942852
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2
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
2007, Springer London, Limited
in English
0387465472 9780387465470
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zzzz
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3
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
June 21, 2007, Springer
in English
0387465464 9780387465463
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- Created April 29, 2008
- 9 revisions
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March 28, 2025 | Edited by ImportBot | Redacting ocaids |
December 29, 2022 | Edited by MARC Bot | import existing book |
September 10, 2021 | Edited by ImportBot | import existing book |
June 29, 2019 | Edited by MARC Bot | import existing book |
April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |