Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

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Last edited by ImportBot
March 28, 2025 | History

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

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Publish Date
Publisher
Springer
Language
English
Pages
328

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Edition Availability
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Nov 10, 2010, Springer
paperback
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
2007, Springer London, Limited
in English
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

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Book Details


Classifications

Library of Congress
TK7888.4TK1-9971TA17, TK7871.99.M44 S23 2007

Edition Identifiers

Open Library
OL7445893M
ISBN 10
0387465464
ISBN 13
9780387465463
OCLC/WorldCat
79447484
LibraryThing
6363014
Goodreads
5028072

Work Identifiers

Work ID
OL19840609W

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
March 28, 2025 Edited by ImportBot Redacting ocaids
December 29, 2022 Edited by MARC Bot import existing book
September 10, 2021 Edited by ImportBot import existing book
June 29, 2019 Edited by MARC Bot import existing book
April 29, 2008 Created by an anonymous user Imported from amazon.com record