Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Defect-Oriented Testing for Nano-Metric CMOS ...
Manoj Sachdev, José Pineda de ...
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Last edited by ImportBot
February 25, 2022 | History

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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Publish Date
Language
English

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Edition Availability
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Nov 10, 2010, Springer
paperback
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
2007, Springer London, Limited
in English

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Book Details


Classifications

Library of Congress
TK7867-7867.5

The Physical Object

Pagination
xxi, 328

Edition Identifiers

Open Library
OL37100331M
ISBN 13
9780387465470

Work Identifiers

Work ID
OL19840609W

Source records

Better World Books record

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February 25, 2022 Created by ImportBot Imported from Better World Books record