An edition of Semiconductors and semimetals
(1997)
Effect of Disorder and Defects in Ion-Implanted Semiconductors
Optical and Photothermal Characterization, Volume 46 (Semiconductors and Semimetals)
by Eicke R. Weber and R. K. Willardson
Share
×Close
This edition doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
Previews available in: English
Subjects
Semiconductors, Semimetals| Edition | Availability |
|---|---|
1
Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and Photothermal Characterization, Volume 46 (Semiconductors and Semimetals)
May 22, 1997, Academic Press
in English
0127521461 9780127521466
|
aaaa
|
2
|
eeee
|
Book Details
First Sentence
"These days a renaissance of the technique of ellipsometry can be witnessed."
Edition Identifiers
Work Identifiers
Community Reviews (0)
Lists
See All
History
- Created April 29, 2008
- 5 revisions
Wikipedia citation
×CloseCopy and paste this code into your Wikipedia page. Need help?
| July 30, 2019 | Edited by MARC Bot | associate edition with work OL19299406W |
| April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
| April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
| April 14, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
| April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |