An edition of IEEE International Workshop on IDDQ Testing (1997)

IEEE International Workshop on IDDQ Testing

digest of papers, November 5-6, 1997, Washington, D.C.

by , , and

Cover of: IEEE International Workshop on IDDQ Testing by IEEE International Workshop on IDDQ Testing (3rd 1997 Washington, D.C.), D. C.) IEEE International Workshop on IDDQ Testing (3rd : 1997 : Washington, Anura P. Jayasumana, IEEE International Workshop on IDDQ Testing (3rd 1997 Washington, D.C.)
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Last edited by Open Library Bot
April 14, 2010 | History
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An edition of IEEE International Workshop on IDDQ Testing (1997)

IEEE International Workshop on IDDQ Testing

digest of papers, November 5-6, 1997, Washington, D.C.

by , , and

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
IEEE Computer Society Press
Language
English
Pages
119

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Subjects

Complementary Metal oxide semiconductors, Congresses, Iddq testing, Metal oxide semiconductors, Complementary, Testing, General Theory of Computing, Storage media & peripherals, Digital Computer Hardware, Computers, Technology & Industrial Arts, Science/Mathematics, General, Logic Design, Computer Engineering, Metal oxide semiconductors, Co
Edition Availability
Cover of: IEEE International Workshop on IDDQ Testing
IEEE International Workshop on IDDQ Testing: Digest of papers, November 5-6, 1997, Washington, D.C
1997, IEEE Computer Society Press
Unknown Binding in English
Cover of: IEEE International Workshop on IDDQ Testing
IEEE International Workshop on IDDQ Testing: digest of papers, November 5-6, 1997, Washington, D.C.
1997, IEEE Computer Society Press
in English
Cover of: IEEE International Workshop on Iddq Testing: November 5-6, 1997, Washington, D.C.
IEEE International Workshop on Iddq Testing: November 5-6, 1997, Washington, D.C. : Digest of Papers
November 1997, Institute of Electrical & Electronics Enginee
Paperback in English

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Book Details

Edition Notes

Includes bibliographic references and index.
"IEEE Computer Society order number PR08123"--T.p. verso.
"IEEE order plan catalog number 97TB100169"--T.p. verso.

Published in
Los Alamitos, Calif
Other Titles
IDDQ testing

Classifications

Dewey Decimal Class
621.39/5/0287
Library of Congress
TK7871.99.M44 I34 1997

The Physical Object

Pagination
ix, 119 p. :
Number of pages
119

Edition Identifiers

Open Library
OL709390M
ISBN 10
0818681233, 081868125X
LCCN
97072789
OCLC/WorldCat
38107699

Work Identifiers

Work ID
OL2769314W

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
April 14, 2010 Edited by Open Library Bot Linked existing covers to the edition.
December 11, 2009 Edited by WorkBot link works
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record