An edition of 2000 IEEE International Workshop on Defect Based Testing
(2000)
2000 IEEE International Workshop on Defect Based Testing
April 30, 2000, Montreal, Canada : proceedings
by IEEE International Workshop on Defect Ba..., Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon, and Quebec) IEEE VLSI Test Symposium (2000 :...
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Subjects
Complementary Metal oxide semiconductors, Congresses, Defects, Iddq testing, Integrated circuits, Electronics engineering, Systems analysis & design, Systems management, Digital Computer Hardware, Metal oxide semiconductors, Complementary, Computers, Technology & Industrial Arts, Computer Books: General, General, Metal oxide semiconductors, Co, Computer Engineering, Testing| Edition | Availability |
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1
2000 IEEE International Workshop on Defect Based Testing: April 30, 2000, Montreal, Canada : proceedings
2000, IEEE Computer Society
in English
0769506372 9780769506371
|
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2
2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada : Proceedings
August 2000, Institute of Electrical & Electronics Enginee
Paperback
in English
0769506372 9780769506371
|
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Book Details
Edition Notes
Includes bibliographical references and index.
"IEEE Catalog Number PR00637"--Cover p. [4].
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- Created April 1, 2008
- 6 revisions
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| July 11, 2024 | Edited by MARC Bot | import existing book |
| July 29, 2020 | Edited by MARC Bot | import existing book |
| April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
| April 14, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
| April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |