Semiconductor reliability.
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Semiconductors, Reliability, CongressesShowing 1 featured edition. View all 1 editions?
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Semiconductor reliability.
1961, Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York
in English
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Edition Notes
Includes bibliographies.
Vol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan.
Vol. 2: Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, Washington, D.C., sponsored by Aerospace Industries Association [and others] Edited by William H. Von Alven.
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- Created April 1, 2008
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| July 12, 2024 | Edited by MARC Bot | import existing book |
| September 28, 2020 | Edited by MARC Bot | import existing book |
| April 2, 2020 | Edited by Michel T. Talbot | Added new cover |
| April 30, 2017 | Edited by ImportBot | import new book |
| April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |