An edition of 1998 IEEE International Integrated Reliability Workshop final report
(1998)
1998 IEEE International Integrated Reliability Workshop final report
Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
by International Integrated Reliability Wor..., IEEE Reliability Society, Institute of Electrical and Electronics ..., IEEE Electron Devices Society, and Ieee Reliability Society
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Subjects
Reliability, Congresses, Integrated circuits, Wafer-scale integration, Circuits & components, Reliability engineering, c 1990 to c 2000, Technology & Industrial Arts, Engineering - Electrical & Electronic, Technology, Science/Mathematics, Electronics - Circuits - General, Electronics - Microelectronics| Edition | Availability |
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1
International Integrated Reliability Workshop Final Report Proceedings: Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
February 2000, IEEE Standards Office
Unknown Binding
in English
0780348826 9780780348820
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2
1998 IEEE International Integrated Reliability Workshop final report: Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
1998, IEEE Electron Devices Society, IEEE Reliability Society
in English
0780348818 9780780348813
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aaaa
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3
1998 International Integrated Reliability Workshop Final Report: Stanford Sierra Camp Lake Tahoe, California October 12-15, 1998
March 1998, Institute of Electrical & Electronics Enginee
Paperback
in English
0780348818 9780780348813
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Book Details
Edition Notes
Includes bibliographical references.
"IEEE Catalog No. 98TH8363"--verso of T.p.
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- Created April 1, 2008
- 7 revisions
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| July 15, 2024 | Edited by MARC Bot | import existing book |
| June 11, 2023 | Edited by ImportBot | import existing book |
| November 28, 2020 | Edited by MARC Bot | import existing book |
| April 14, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
| April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |