An edition of Semiconductor Devices in Harsh Conditions (2016)

Semiconductor Devices in Harsh Conditions

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Semiconductor Devices in Harsh Conditions
Kirsten Weide-Zaage, Malgorzat ...
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Last edited by ImportBot
October 7, 2021 | History
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An edition of Semiconductor Devices in Harsh Conditions (2016)

Semiconductor Devices in Harsh Conditions

by and

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Publish Date
Publisher
Taylor & Francis Group
Language
English

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Subjects
Semiconductors, Extreme environments, Environmental testing, Reliability, Semi-conducteurs, Fiabilité, Milieux extrêmes, Essais d'environnement, Accelerated weathering

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Edition Availability
Cover of: Semiconductor Devices in Harsh Conditions
Semiconductor Devices in Harsh Conditions
2020, Taylor & Francis Group
in English
  • Not in Library
Libraries near you: WorldCat
Cover of: Semiconductor Devices in Harsh Conditions
Semiconductor Devices in Harsh Conditions
2016, Taylor & Francis Group
in English
Libraries near you: WorldCat
Cover of: Semiconductor Devices in Harsh Conditions
Semiconductor Devices in Harsh Conditions
2016, Taylor & Francis Group
in English
Libraries near you: WorldCat
Cover of: Semiconductor Devices in Harsh Conditions
Semiconductor Devices in Harsh Conditions
2016, Taylor & Francis Group
in English
Libraries near you: WorldCat
Cover of: Semiconductor Devices in Harsh Conditions
Semiconductor Devices in Harsh Conditions
2016, Taylor & Francis Group
in English
Libraries near you: WorldCat
Cover of: Semiconductor Devices in Harsh Conditions
Semiconductor Devices in Harsh Conditions
2016, Taylor & Francis Group
in English
Libraries near you: WorldCat

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Book Details

Classifications

Library of Congress
TK7871.85.S449 2020

The Physical Object

Pagination
234

ID Numbers

Open Library
OL34681174M
ISBN 13
9780367656362

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October 7, 2021 Created by ImportBot Imported from Better World Books record